Modeling and Measurement of Carrier Trapping and Tunneling in AlxIn1-xAsySb1-y Digital Alloys

Author
Stephen D. March
Andrew H. Jones
Ann K. Rockwell
Min Ren
Yaojia Chen
Madison E. Woodson
Scott J. Maddox
Joe C. Campbell
Seth R. Bank
Year of Publication
2019
Month Published
06
Conference Location
Ann Arbor, MI
Download citation