Modeling and Measurement of Carrier Trapping and Tunneling in Al<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>Sb<sub>1-y</sub> Digital Alloys
| Author | |
|---|---|
| Year of Publication |
2019
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| Month Published |
06
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| Conference Location |
Ann Arbor, MI
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| Download citation |