Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor
| Author | |
|---|---|
| Year Published |
2018
|
| Journal |
Nanoscale and Microscale Thermophysical Engineering
|
| Volume |
22
|
| Number of Pages |
348-359
|
| Month Published |
08
|
| URL |
https://doi.org/10.1080/15567265.2018.1503382
|
| DOI |
10.1080/15567265.2018.1503382
|
| Download citation |