Publications

Displaying 8 publications
Quote related keywords (e.g. "66th Electronic Materials Conf.")

Journal Article

  1. R. Maiti, C. Patil, M. A. S. R. Saadi, T. Xie, J. G. Azadani, B. Uluutku, R. Amin, A. F. Briggs, M. Miscuglio, D. Van. Thourhout, S. D. Solares, T. Low, R. Agarwal, S. R. Bank, and V. J. Sorger, "Strain-engineered high-responsivity MoTe2 photodetector for silicon photonic integrated circuits," Nature Photonics, Jun 2020. Digital object identifier
  2. J. Jeong, X. Meng, A. K. Rockwell, S. R. Bank, W. Hsieh, J. Lin, and Y. Wang, "Picosecond transient thermoreflectance for thermal conductivity characterization," Nanoscale and Microscale Thermophysical Engineering, vol. 0, no. 0, Feb 2019. Digital object identifier
  3. J. Park, J. Kang, X. Liu, S. J. Maddox, K. Tang, P. C. McIntrye, S. R. Bank, and M. L. Brongersma, "Dynamic thermal emission control with InAs-based plasmonic metasurfaces," Science Advances, vol. 4, no. 12, Dec 2018. Digital object identifier
  4. K. Chen, X. Meng, F. He, Y. Zhou, J. Jeong, N. T. Sheehan, S. R. Bank, and Y. Wang, "Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 4, pp. 348-359, Aug 2018. Digital object identifier
  5. J. Jeong, K. Chen, E. S. Walker, N. Roy, F. He, P. Liu, G. Willson, M. Cullinan, S. R. Bank, and Y. Wang, "In-Plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 2, pp. 83-96, Dec 2017. Digital object identifier

Conference Paper

  1. R. Maiti, C. Patil, T. Xie, J. G. Azadani, R. Amin, M. Miscuglio, D. Van. Thourhout, T. Low, S. R. Bank, and V. J. Sorger, "Strain-Engineered MoTe2 Photodetector in Silicon Photonics at 1550 nm," Conference on Lasers and Electro-Optics (CLEO), Washington, DC, Jun 2020.
  2. J. Jeong, K. Chen, E. S. Walker, S. R. Bank, and Y. Wang, "Nanosecond Grating Imaging Technique for Measuring Thermal Transport Properties," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.
  3. D. J. Ironside, E. M. Krivoy, V. D. Dasika, E. S. Walker, K. Nguyen, J. Jeong, Y. Wang, and S. R. Bank, "Tailored III-V Metamorphic Buffer Layers utilizing Embedded Rare Earth Monopnictides for Optoelectronic Applications," 57th Electronic Materials Conf. (EMC), Columbus, OH, Jun 2015.