Publications

Displaying 15 publications
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Journal Article

  1. K. Yao, J. Fang, T. Jiang, A. F. Briggs, A. M. Skipper, Y. Kim, M. A. Belkin, B. A. Korgel, S. R. Bank, and Y. Zheng, "Tuning Multipolar Mie Scattering of Particles on a Dielectric-Covered Mirror," ACS Nano, vol. 18, pp. 16545-16555, Jun 2024. Digital object identifier
  2. J. Jeong, X. Meng, A. K. Rockwell, S. R. Bank, W. Hsieh, J. Lin, and Y. Wang, "Picosecond transient thermoreflectance for thermal conductivity characterization," Nanoscale and Microscale Thermophysical Engineering, vol. 0, no. 0, Feb 2019. Digital object identifier
  3. K. Chen, X. Meng, F. He, Y. Zhou, J. Jeong, N. T. Sheehan, S. R. Bank, and Y. Wang, "Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 4, pp. 348-359, Aug 2018. Digital object identifier
  4. B. B.Rajeeva, Z. Wu, A. F. Briggs, P. V. Acharya, B. Walker, X. Peng, V. Bahadur, S. R. Bank, and Y. Zheng, "Direct-Write Printing: “Point-and-Shoot” Synthesis of Metallic Ring Arrays and Surface-Enhanced Optical Spectroscopy," Advanced Optical Materials, vol. 6, no. 10, May 2018. Digital object identifier
  5. B. B.Rajeeva, Z. Wu, A. F. Briggs, P. V. Acharya, S. B. Walker, X. Peng, V. Bahadur, S. R. Bank, and Y. Zheng, "“Point‐and‐Shoot” Synthesis of Metallic Ring Arrays and Surface‐Enhanced Optical Spectroscopy," Advanced Optical Materials, vol. 6, no. 10, Mar 2018. Digital object identifier
  6. J. Jeong, K. Chen, E. S. Walker, N. Roy, F. He, P. Liu, G. Willson, M. Cullinan, S. R. Bank, and Y. Wang, "In-Plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 2, pp. 83-96, Dec 2017. Digital object identifier
  7. Z. Wu, G. Kelp, M. N. Yogeesh, W. Li, K. M. McNicholas, A. F. Briggs, B. B.Rajeeva, D. Akinwande, S. R. Bank, G. Shvets, and Y. Zheng, "Dual-Band Moire Metasurface Patches for Multifunctional Biomedical Applications," Nanoscale, vol. 8, pp. 18461, Sep 2016. Digital object identifier
  8. Z. Wu, W. Li, M. N. Yogeesh, S. Jung, A. Lynghi. Lee, K. M. McNicholas, A. F. Briggs, S. R. Bank, M. A. Belkin, D. Akinwande, and Y. Zheng, "Tunable Graphene Metasurfaces with Gradient Features by Self-Assembly-Based Moire Nanosphere Lithography," Advanced Optical Materials, Aug 2016. Digital object identifier

Conference Paper

  1. E. Y. Wang, H. Karimi, M. Waqar, X. Pan, J. C. Campbell, and S. R. Bank, "Growth and Characterization of Ternary-Containing AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  2. E. Y. Wang, J. A. McArthur, H. Karimi, P. Devaney, J. C. Campbell, and S. R. Bank, "Effect of Varying Period Structure on Tunneling Current in AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  3. J. A. McArthur, A. A. Dadey, E. Y. Wang, H. Karimi, J. C. Campbell, and S. R. Bank, "Suppressing AlInAsSb Avalanche Photodiode Dark Currents by Tuning the Absorption Region," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  4. J. A. McArthur, H. Karimi, L. Sauer, J. C. Campbell, and S. R. Bank, "Manipulating the opto-electronic properties of AlInAsSb digital alloys by adjusting the period thickness," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.
  5. B. B.Rajeeva, Z. Wu, A. F. Briggs, P. V. Acharya, V. Bahadur, S. R. Bank, and Y. Zheng, "In-situ Point-and-Shoot Fabrication of Metallic Rings for Mid-IR/Visible Sensing," Conf. on Lasers and Electro Optics (CLEO), San Jose, CA, May 2018.
  6. J. Jeong, K. Chen, E. S. Walker, S. R. Bank, and Y. Wang, "Nanosecond Grating Imaging Technique for Measuring Thermal Transport Properties," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.
  7. D. J. Ironside, E. M. Krivoy, V. D. Dasika, E. S. Walker, K. Nguyen, J. Jeong, Y. Wang, and S. R. Bank, "Tailored III-V Metamorphic Buffer Layers utilizing Embedded Rare Earth Monopnictides for Optoelectronic Applications," 57th Electronic Materials Conf. (EMC), Columbus, OH, Jun 2015.