Publications

Displaying 6 publications
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Journal Article

  1. K. W. Park, H. P. Nair, A. M. Crook, S. R. Bank, and E. T. Yu, "Quantitative scanning thermal microscopy of ErAs/GaAs superlattice structures grown by molecular beam epitaxy," APL, vol. 102, no. 6, pp. 061912, Feb 2013. Digital object identifier

Conference Paper

  1. S. E. Muschinske, E. S. Walker, C. J. Brennan, Y. Sun, A. Yau, T. Trivedi, A. Roy, S. D. March, A. F. Briggs, E. M. Krivoy, D. Akinwande, M. L. Lee, E. T. Yu, and S. R. Bank, "Epitaxial Growth and Characterization of 2-D BixSb1-x Alloys on Si(111)," 60th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2018.
  2. K. M. McNicholas, D. J. Ironside, R. H. El-Jaroudi, H. S. Maczko, G. Cossio, L. J. Nordin, S. D. Sifferman, R. Kudrawiec, E. T. Yu, D. Wasserman, and S. R. Bank, "BGaAs/GaP heteroepitaxy for strain-free luminescent layers on Si," 60th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2018.
  3. V. D. Dasika, E. M. Krivoy, H. P. Nair, S. J. Maddox, K. W. Park, D. Jung, M. L. Lee, E. T. Yu, and S. R. Bank, "InAs Quantum Dot Growth using Bismuth as a Surfactant for Optoelectronic Applications," Conf. on Lasers and Electro Optics (CLEO), San Jose, CA, Jun 2013.
  4. K. W. Park, H. P. Nair, E. M. Krivoy, S. R. Bank, and E. T. Yu, "Thermal characterization of rare earth/III-V superlattice and nanocomposite structures using scanned probe microscopy," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.
  5. K. W. Park, H. P. Nair, S. R. Bank, and E. T. Yu, "Proximal Probe Characterization of Thermal Conductivity in ErAs/GaAs Superlattice Grown by Molecular Beam Epitaxy," 40th Conference on the Physics & Chemistry of Surfaces & Interfaces, Waikoloa, HI, Jan 2013.