Publications

Displaying 7 publications
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Journal Article

  1. R. Ramesh, T. Hsieh, A. M. Skipper, Q. Meng, K. C. Wen, F. Shafiei, M. A. Wistey, M. C. Downer, J. B. Khurgin, and S. R. Bank, "Interband second-order nonlinear optical susceptibility of asymmetric coupled quantum wells," Applied Physics Letters, vol. 123, no. 25, Dec 2023. Digital object identifier
  2. Z. Dang, W. Wang, J. Chen, E. S. Walker, S. R. Bank, D. Akinwande, Z. Ni, and L. Tao, "Vis-NIR photodetector with microsecond response enabled by 2D bismuth/Si(111) heterojunction," 2D Materials, vol. 8, no. 3, pp. 035002, Mar 2021. Digital object identifier
  3. W. Zhong, Y. Zhao, B. Zhu, J. Sha, E. S. Walker, S. R. Bank, Y. Chen, D. Akinwande, and L. Tao, "Anisotropic thermoelectric effect and field-effect devices in epitaxial bismuthene on Si (111)," Nanotechnology, vol. 31, no. 47, Sep 2020. Digital object identifier
  4. E. S. Walker, S. Ryul. Na, D. Jung, S. D. March, J. Kim, T. Trivedi, W. Li, L. Tao, M. L. Lee, K. M. Liechti, D. Akinwande, and S. R. Bank, "Large-Area Dry Transfer of Single-Crystalline Epitaxial Bismuth Thin Films," Nano Letters, vol. 16, no. 11, pp. 6931-6938, Oct 2016. Digital object identifier

Conference Paper

  1. J. Duncan, R. Ramesh, A. F. Ricks, M. Brown, Z. Sakotic, F. A. Estévez, F. Shafiei, M. W. Downer, D. Wasserman, and S. R. Bank, "Optical Structuring to Reliably Determine Interband Optical Nonlinearity via Second Harmonic Generation," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  2. R. Ramesh, T. Hsieh, A. M. Skipper, Q. Meng, K. C. Wen, M. A. Wistey, F. Shafiei, M. W. Downer, J. B. Khurgin, and S. R. Bank, "Engineering of the Interband Second Order Optical Nonlinearity with Asymmetric Coupled Quantum Wells," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.
  3. E. S. Walker, S. Ryul. Na, D. Jung, S. D. March, Y. Liu, T. Trivedi, W. Li, L. Tao, M. L. Lee, K. M. Liechti, D. Akinwande, and S. R. Bank, "Growth and Transfer of Epitaxial Bismuth Films for Flexible Electronics," 58th Electronic Materials Conf. (EMC), Newark, DE, Jun 2016.