Publications

Displaying 6 publications
Quote related keywords (e.g. "66th Electronic Materials Conf.")

Journal Article

  1. N. D. Foster, A. K. Rockwell, J. A. McArthur, B. S. Mendoza, S. R. Bank, and M. C. Downer, "A Study of Second-Order Susceptibility in Digital Alloy-Grown InAs/AlSb Multiple Quantum Wells," Advanced Optical Materials, vol. 10, no. 2192845, May 2022. Digital object identifier
  2. A. K. Rockwell, M. Ren, M. E. Woodson, A. H. Jones, S. D. March, Y. Tan, Y. Yuan, Y. Sun, R. Hool, S. J. Maddox, M. L. Lee, A. W. Ghosh, J. C. Campbell, and S. R. Bank, "Toward Deterministic Construction of Low Noise Avalanche Photodetector Materials," Applied Physics Letters, vol. 113, no. 10, pp. 102106, Dec 2018. Digital object identifier
  3. S. Rahimi, E. M. Krivoy, J. Lee, M. E. Michael, S. R. Bank, and D. Akinwande, "Temperature dependence of the electrical resistivity of LaLuAs," AIP Advances, vol. 3, no. 8, pp. 082102, Jul 2013. Digital object identifier

Conference Paper

  1. N. D. Foster, A. K. Rockwell, J. A. McArthur, M. Santoyo, S. R. Bank, and M. C. Downer, "Measurement of chi(2) of III-V quantum well structures," Bulletin of the American Physical Society, Mar 2021.
  2. N. D. Foster, A. K. Rockwell, S. R. Bank, and M. C. Downer, "Analysis of chi(2) of III-V quantum-well structures using transfer matrix techniques," American Physical Society March Meeting (APS), Denver, CO, Mar 2020.
  3. S. Rahimi, E. M. Krivoy, J. Lee, S. R. Bank, and D. Akinwande, "Temperature and Thickness Dependence of Electrical Resistivity of LaLuAs," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.