Publications
Journal Article
- R. Ramesh, T. Hsieh, A. M. Skipper, Q. Meng, K. C. Wen, F. Shafiei, M. A. Wistey, M. C. Downer, J. B. Khurgin, and S. R. Bank, "Interband second-order nonlinear optical susceptibility of asymmetric coupled quantum wells," Applied Physics Letters, vol. 123, no. 25, Dec 2023.
- N. D. Foster, A. K. Rockwell, J. A. McArthur, B. S. Mendoza, S. R. Bank, and M. C. Downer, "A Study of Second-Order Susceptibility in Digital Alloy-Grown InAs/AlSb Multiple Quantum Wells," Advanced Optical Materials, vol. 10, no. 2192845, May 2022.
- S. Rahimi, E. M. Krivoy, J. Lee, M. E. Michael, S. R. Bank, and D. Akinwande, "Temperature dependence of the electrical resistivity of LaLuAs," AIP Advances, vol. 3, no. 8, pp. 082102, Jul 2013.
- M. M. Oye, T. J. Mattord, G. A. Hallock, S. R. Bank, M. A. Wistey, J. M. Reifsnider, A. J. Ptak, H. B. Yuen, J. S. Harris, and A. L. Holmes Jr., "Effects of different plasma species (atomic N, metastable N2*, and ions) on the optical properties of dilute nitride materials grown by plasma-assisted molecular-beam epitaxy," APL, vol. 91, no. 19, pp. 191903, Sep 2007.
- M. M. Oye, M. A. Wistey, J. M. Reifsnider, S. Agarwal, T. J. Mattord, S. Govindaraju, G. A. Hallock, A. L. Holmes Jr., S. R. Bank, H. B. Yuen, and J. S. Harris, "Ion damage effects from negative deflector plate voltages during the plasma-assisted molecular-beam epitaxy growth of dilute nitrides," APL, vol. 86, no. 22, pp. 221902, May 2005.
Conference Paper
- N. D. Foster, A. K. Rockwell, J. A. McArthur, M. Santoyo, S. R. Bank, and M. C. Downer, "Measurement of chi(2) of III-V quantum well structures," Bulletin of the American Physical Society, Mar 2021.
- N. D. Foster, A. K. Rockwell, S. R. Bank, and M. C. Downer, "Analysis of chi(2) of III-V quantum-well structures using transfer matrix techniques," American Physical Society March Meeting (APS), Denver, CO, Mar 2020.
- S. Rahimi, E. M. Krivoy, J. Lee, S. R. Bank, and D. Akinwande, "Temperature and Thickness Dependence of Electrical Resistivity of LaLuAs," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.