Publications
Conference Paper
- J. A. McArthur, A. A. Dadey, E. Y. Wang, H. Karimi, J. C. Campbell, and S. R. Bank, "Suppressing AlInAsSb Avalanche Photodiode Dark Currents by Tuning the Absorption Region," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
- E. Y. Wang, H. Karimi, M. Waqar, X. Pan, J. C. Campbell, and S. R. Bank, "Growth and Characterization of Ternary-Containing AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
- E. Y. Wang, J. A. McArthur, H. Karimi, P. Devaney, J. C. Campbell, and S. R. Bank, "Effect of Varying Period Structure on Tunneling Current in AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
- S. P. Mallick, E. Y. Wang, J. A. McArthur, C. Du, S. D. March, X. Pan, and S. R. Bank, "The effect of group-V "Blow-by" on the structural and optical properties of Alx In1-x Asy Sb1-y digital alloys grown by molecular beam epitaxy," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.
- E. Y. Wang, J. A. McArthur, A. A. Dadey, M. Fetters, A. W. K. Liu, J. M. Fastenau, J. C. Campbell, and S. R. Bank, "Growth and characterization of Alx In1-x Asy Sb1-y digital alloys on InP on Si," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.
- E. Y. Wang, J. A. McArthur, A. K. Rockwell, and S. R. Bank, "Growth and characterization of AlxIn1-xAsySb1-y digital alloys grown on InP," 64th Electronic Materials Conf. (EMC), Columbus, OH, Jun 2022.
- H. B. Yuen, S. R. Bank, M. A. Wistey, H. P. Bae, J. S. Harris, and A. Moto, "Effects of N2 Flow on GaInNAs Grown by a RF Plasma cell in MBE," Materials Research Symposium (MRS), San Franciso, CA, Apr 2004.
- H. B. Yuen, V. Lordi, S. R. Bank, M. A. Wistey, J. S. Harris, and A. Moto, "Analysis of Material Properties of GaNAs(Sb) Grown by MBE," Materials Research Symposium (MRS), Boston, MA, Dec 2003.
- H. B. Yuen, S. R. Bank, M. A. Wistey, A. Moto, and J. S. Harris, "An Investigation of GaNAs(Sb) for Strain Compensated Active Regions at 1. 3 and 1. 55 \µm," 45th Electronic Materials Conf. (EMC), Salt Lake City, UT, Jun 2003.