Publications

Displaying 8 publications
Quote related keywords (e.g. "66th Electronic Materials Conf.")

Journal Article

  1. K. Li, E. Simmons, A. F. Briggs, S. R. Bank, D. Wasserman, V. A. Podolskiy, and E. E. Narimanov, "Ballistic Metamaterials," Optica, vol. 7, no. 12, pp. 1773-1780, Dec 2020. Digital object identifier
  2. R. Maiti, C. Patil, M. A. S. R. Saadi, T. Xie, J. G. Azadani, B. Uluutku, R. Amin, A. F. Briggs, M. Miscuglio, D. Van. Thourhout, S. D. Solares, T. Low, R. Agarwal, S. R. Bank, and V. J. Sorger, "Strain-engineered high-responsivity MoTe2 photodetector for silicon photonic integrated circuits," Nature Photonics, Jun 2020. Digital object identifier
  3. S. Rahimi, E. M. Krivoy, J. Lee, M. E. Michael, S. R. Bank, and D. Akinwande, "Temperature dependence of the electrical resistivity of LaLuAs," AIP Advances, vol. 3, no. 8, pp. 082102, Jul 2013. Digital object identifier

Conference Paper

  1. R. Maiti, C. Patil, T. Xie, J. G. Azadani, R. Amin, M. Miscuglio, D. Van. Thourhout, T. Low, S. R. Bank, and V. J. Sorger, "Strain-Engineered MoTe2 Photodetector in Silicon Photonics at 1550 nm," Conference on Lasers and Electro-Optics (CLEO), Washington, DC, Jun 2020.
  2. K. Li, E. Simmons, A. F. Briggs, S. R. Bank, E. E. Narimanov, V. A. Podolskly, and D. Wasserman, "Interrogating Hyperbolic Metamaterials with Integrated Intersubband Transitions Using Thermal Emission Spectroscopy," 61st Electronic Materials Conf. (EMC), Ann Arbor, MI, Jun 2019.
  3. E. Simmons, K. Li, A. F. Briggs, S. R. Bank, D. Wasserman, E. E. Narimanov, and V. A. Podolskiy, "Quantum to Classical Transitions in Multilayer Plasmonic Metamaterials," Conf. on Lasers and Electro Optics (CLEO), San Jose, CA, May 2019.
  4. E. Simmons, K. Li, A. F. Briggs, S. R. Bank, D. Wasserman, E. E. Narimanov, and V. A. Podolskiy, "Quantum to Classical Transitions in Multilayer Plasmonic Metamaterials," American Physical Society March Meeting (APS), Boston, MA, Mar 2019.
  5. S. Rahimi, E. M. Krivoy, J. Lee, S. R. Bank, and D. Akinwande, "Temperature and Thickness Dependence of Electrical Resistivity of LaLuAs," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.