Publications

Displaying 2 publications
Quote related keywords (e.g. "66th Electronic Materials Conf.")

Journal Article

  1. T. Kim, A. M. Skipper, S. R. Bank, and E. T. Yu, "Nanoscale electrical conductance and leakage currents in etched and selective-area regrown GaAs pn junctions," Journal of Applied Physics, vol. 137, no. 7, pp. 075702, Feb 2025. Digital object identifier

Conference Paper

  1. S. P. Mallick, E. Y. Wang, J. A. McArthur, C. Du, S. D. March, X. Pan, and S. R. Bank, "The effect of group-V "Blow-by" on the structural and optical properties of Alx In1-x Asy Sb1-y digital alloys grown by molecular beam epitaxy," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.