Publications

Displaying 8 publications
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Journal Article

  1. M. Wagner, A. S. McLeod, S. J. Maddox, Z. Fei, M. Liu, R. D. Averitt, M. M. Fogler, S. R. Bank, F. Keilmann, and D. N. Basov, "Ultrafast Dynamics of Surface Plasmons in InAs by Time-Resolved Infrared Nanospectroscopy," Nano Lett., vol. 14, no. 8, pp. 4529, Aug 2014. Digital object identifier
  2. S. Rahimi, E. M. Krivoy, J. Lee, M. E. Michael, S. R. Bank, and D. Akinwande, "Temperature dependence of the electrical resistivity of LaLuAs," AIP Advances, vol. 3, no. 8, pp. 082102, Jul 2013. Digital object identifier

Conference Paper

  1. E. Y. Wang, H. Karimi, M. Waqar, X. Pan, J. C. Campbell, and S. R. Bank, "Growth and Characterization of Ternary-Containing AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  2. E. Y. Wang, J. A. McArthur, H. Karimi, P. Devaney, J. C. Campbell, and S. R. Bank, "Effect of Varying Period Structure on Tunneling Current in AlInAsSb Digital Alloys," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  3. J. A. McArthur, A. A. Dadey, E. Y. Wang, H. Karimi, J. C. Campbell, and S. R. Bank, "Suppressing AlInAsSb Avalanche Photodiode Dark Currents by Tuning the Absorption Region," 66th Electronic Materials Conf. (EMC), College Park, Maryland, Jun 2024.
  4. J. A. McArthur, H. Karimi, L. Sauer, J. C. Campbell, and S. R. Bank, "Manipulating the opto-electronic properties of AlInAsSb digital alloys by adjusting the period thickness," 65th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2023.
  5. M. Wagner, Z. Fei, A. S. McLeod, S. J. Maddox, A. S. Rodin, W. Bao, E. G. Iwinski, Z. Zhao, M. Goldflam, M. Liu, G. Dominguez, M. Thiemens, M. M. Fogler, A. H. Castro-Neto, C. N. Lau, S. Amarie, F. Keilmann, S. R. Bank, R. D. Averitt, and D. N. Basov, "Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors," Microscopy & Microanalaysis, Portland, OR, Aug 2015.
  6. S. Rahimi, E. M. Krivoy, J. Lee, S. R. Bank, and D. Akinwande, "Temperature and Thickness Dependence of Electrical Resistivity of LaLuAs," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.