Publications

Displaying 9 publications
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Journal Article

  1. J. Jeong, K. Chen, E. S. Walker, N. Roy, F. He, P. Liu, G. Willson, M. Cullinan, S. R. Bank, and Y. Wang, "In-Plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 2, pp. 83-96, Dec 2017. Digital object identifier
  2. A. H. Jones, Y. Yuan, M. Ren, S. J. Maddox, S. R. Bank, and J. C. Campbell, "AlxIn1-xAsySb1-y photodiodes with low avalanche breakdown temperature dependence," Optics Express, vol. 25, no. 20, pp. 24340–24345, Oct 2017. Digital object identifier
  3. M. Ren, S. J. Maddox, M. E. Woodson, J. Chen, S. R. Bank, and J. C. Campbell, "Characteristics of AlxIn1-xAsySb1-y (x:0. 3~0. 7) Avalanche Photodiodes," IEEE/OSA Journal of Lightwave Technology, vol. 35, pp. 2380, Jun 2017. Digital object identifier
  4. K. Chen, N. T. Sheehan, F. He, X. Meng, S. C. Mason, S. R. Bank, and Y. Wang, "Measurement of Ambipolar Diffusion Coefficient of Photoexcited Carriers with Ultrafast Reflective Grating-Imaging Technique," ACS Photonics, vol. 4, pp. 1440-1446, May 2017. Digital object identifier

Conference Paper

  1. M. Ren, Y. Yuan, A. H. Jones, S. J. Maddox, M. E. Woodson, S. R. Bank, and J. C. Campbell, "Operation stability study of AlInAsSb avalanche photodiodes," 2017 IEEE Photonics Conference (IPC), Orlando, FL, Oct 2017.
  2. (Invited) S. J. Maddox, A. K. Rockwell, M. Ren, M. E. Woodson, J. C. Campbell, and S. R. Bank, "Recent advances in low noise staircase and conventional avalanche photodiodes," 75th Device Research Conference (DRC), South Bend, IN, Jun 2017.
  3. S. D. Sifferman, A. K. Rockwell, K. M. McNicholas, Y. Sun, R. Salas, S. J. Maddox, H. P. Nair, M. L. Lee, and S. R. Bank, "The effects of a bismuth flux on strained-layer III-V optical materials," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.
  4. A. K. Rockwell, M. E. Woodson, M. Ren, K. M. McNicholas, S. D. Sifferman, S. J. Maddox, J. C. Campbell, and S. R. Bank, "Surfactant-Mediated Epitaxy of III-V Digital Alloys," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.
  5. J. Jeong, K. Chen, E. S. Walker, S. R. Bank, and Y. Wang, "Nanosecond Grating Imaging Technique for Measuring Thermal Transport Properties," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.