Publications
Conference Paper
- (Invited) S. R. Bank, X. Xue, S. D. March, Y. Yuan, A. H. Jones, A. K. Rockwell, and J. C. Campbell, "Towards Single Photon Counting at Room Temperature with Digital Alloy Avalanche Photodiodes," IEEE Research and Applications of Photonics in Defense (RAPID), Miramar Beach, FL, Aug 2020.
- A. K. Rockwell, A. H. Jones, Y. Yuan, X. Xue, S. D. March, J. C. Campbell, and S. R. Bank, "Temperature Stability of III-V Digital Alloy Bandgaps," 62nd Electronic Materials Conf. (EMC), Columbus, OH, Jun 2020.
- A. K. Rockwell, M. Ren, M. E. Woodson, A. H. Jones, S. D. March, Y. Tan, Y. Yuan, S. J. Maddox, A. W. Ghosh, J. C. Campbell, and S. R. Bank, "Band Structure Influence on Noise Properties of III-V Digital Alloys," 61st Electronic Materials Conf. (EMC), Ann Arbor, MI, Jun 2019.
- S. R. Bank, J. C. Campbell, S. J. Maddox, A. K. Rockwell, M. E. Woodson, M. Ren, A. H. Jones, S. D. March, J. Zheng, and Y. Yuan, "Digital alloy growth of low-noise avalanche photodiodes," IEEE RAPID, Miramar Beach, FL, Aug 2018.
- (Invited) S. R. Bank, J. C. Campbell, S. J. Maddox, M. Ren, A. K. Rockwell, M. E. Woodson, A. H. Jones, S. D. March, J. Zheng, and Y. Yuan, "Low-Noise Staircase and Conventional Avalanche Photodiodes," International Nano-Optoelectronics Workshop (iNOW), Berkeley, CA, Jul 2018.
- A. K. Rockwell, Y. Yuan, S. D. March, A. H. Jones, M. E. Woodson, M. Ren, S. D. Sifferman, S. J. Maddox, J. C. Campbell, and S. R. Bank, "III-V Digital Alloys for Mid-IR Photodetectors," 60th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2018.
- M. Ren, Y. Yuan, A. H. Jones, S. J. Maddox, M. E. Woodson, S. R. Bank, and J. C. Campbell, "Operation stability study of AlInAsSb avalanche photodiodes," 2017 IEEE Photonics Conference (IPC), Orlando, FL, Oct 2017.
- J. Jeong, K. Chen, E. S. Walker, S. R. Bank, and Y. Wang, "Nanosecond Grating Imaging Technique for Measuring Thermal Transport Properties," 59th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2017.
- K. Chen, D. Akinwande, S. R. Bank, and Y. Wang, "A Novel Optical Grating Technique to Measure Photo-Excited Carrier Transport Property in Electronic Materials," 58th Electronic Materials Conf. (EMC), Newark, DE, Jun 2016.
- K. Chen, Y. Wang, D. Akinwande, S. R. Bank, and J. Lin, "A novel grating-imaging method to measure carrier diffusion coefficient in graphene," American Physical Society (APS) March Meeting, Baltimore, MD, Mar 2016.