Publications

Displaying 32 publications
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Journal Article

  1. D. Chen, S. D. March, A. H. Jones, Y. Shen, A. A. Dadey, K. Sun, J. A. McArthur, A. M. Skipper, X. Xue, B. Guo, J. Bai, S. R. Bank, and J. C. Campbell, "Photon-trapping-enhanced avalanche photodiodes for mid-infrared applications," Nature Photonics, May 2023. Digital object identifier
  2. D. Chen, K. Sun, Y. Chen, A. H. Jones, A. A. Dadey, B. Guo, J. A. McArthur, S. R. Bank, and J. C. Campbell, "Frequency behavior of AlInAsSb nBn photodetectors and the development of an equivalent circuit model," Optics Express, vol. 30, no. 14, pp. 25262, Jul 2022. Digital object identifier
  3. A. H. Jones, Y. Shen, K. Sun, D. Chen, S. D. March, S. R. Bank, and J. C. Campbell, "Room-temperature bandwidth of 2-\&microm AlInAsSb avalanche photodiodes," Optics Express, vol. 29, no. 23, pp. 38939-38945, Nov 2021. Digital object identifier
  4. R. Wang, D. Chen, J. A. McArthur, X. Xue, A. H. Jones, S. R. Bank, and J. C. Campbell, "Al0. 3InAsSb/Al0. 7InAsSb Digital Alloy nBn Photodetectors," Journal of Lightwave Technology, vol. 40, no. 1, pp. 113-120, Oct 2021. Digital object identifier
  5. D. Chen, R. Wang, J. A. McArthur, X. Xue, A. H. Jones, S. R. Bank, and J. C. Campbell, "Demonstration of infrared nBn photodetectors based on the AlInAsSb digital alloy materials system," Applied Physics Letters, vol. 119, no. 3, pp. 031101, Jul 2021. Digital object identifier
  6. D. Chen, J. A. McArthur, S. D. March, X. Xue, A. H. Jones, A. A. Dadey, S. R. Bank, and J. C. Campbell, "Comparison and analysis of Al0. 7InAsSb avalanche photodiodes with different background doping polarities," Applied Physics Letters, vol. 119, no. 3, pp. 032101, Jul 2021. Digital object identifier
  7. F. He, N. T. Sheehan, S. R. Bank, and Y. Wang, "Giant electron-phonon coupling detected under surface plasmon resonance in Au film," Opt. Lett., vol. 44, no. 18, pp. 4590-4593, Sep 2019. Digital object identifier
  8. K. Chen, X. Meng, F. He, Y. Zhou, J. Jeong, N. T. Sheehan, S. R. Bank, and Y. Wang, "Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor," Nanoscale and Microscale Thermophysical Engineering, vol. 22, no. 4, pp. 348-359, Aug 2018. Digital object identifier
  9. K. Chen, N. T. Sheehan, F. He, X. Meng, S. C. Mason, S. R. Bank, and Y. Wang, "Measurement of Ambipolar Diffusion Coefficient of Photoexcited Carriers with Ultrafast Reflective Grating-Imaging Technique," ACS Photonics, vol. 4, pp. 1440-1446, May 2017. Digital object identifier
  10. K. Chen, M. N. Yogeesh, Y. Huang, S. Zhang, F. He, X. Meng, S. Fang, N. T. Sheehan, T. H. Tao, S. R. Bank, J. Lin, D. Akinwande, P. Sutter, T. Lai, and Y. Wang, "Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique," Carbon, vol. 107, pp. 233-239, Oct 2016. Digital object identifier
  11. (Invited) S. D. Sifferman, H. P. Nair, R. Salas, N. T. Sheehan, S. J. Maddox, A. M. Crook, and S. R. Bank, "Highly strained mid-infrared type-I diode lasers on GaSb," IEEE J. Sel. Top. Quantum Electron., vol. 21, no. 6, pp. 248-257, Nov 2015. Digital object identifier
  12. K. W. Park, E. M. Krivoy, H. P. Nair, S. R. Bank, and E. T. Yu, "Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy," Nanotechnology, vol. 26, no. 26, pp. 265701, Jul 2015. Digital object identifier
  13. V. D. Dasika, E. M. Krivoy, H. P. Nair, S. J. Maddox, K. W. Park, D. Jung, M. L. Lee, E. T. Yu, and S. R. Bank, "Increased InAs Quantum Dot Size and Density using Bismuth as a Surfactant," APL, vol. 105, no. 25, pp. 253104, Dec 2014. Digital object identifier
  14. K. W. Park, H. P. Nair, A. M. Crook, S. R. Bank, and E. T. Yu, "Quantitative scanning thermal microscopy of ErAs/GaAs superlattice structures grown by molecular beam epitaxy," APL, vol. 102, no. 6, pp. 061912, Feb 2013. Digital object identifier
  15. K. W. Park, V. D. Dasika, H. P. Nair, A. M. Crook, S. R. Bank, and E. T. Yu, "Conductivity and structure of ErAs nanoparticles embedded in GaAs pn junctions analyzed via conductive atomic force microscopy," APL, vol. 100, no. 23, pp. 233117, Jun 2012. Digital object identifier
  16. K. W. Park, H. P. Nair, A. M. Crook, S. R. Bank, and E. T. Yu, "Scanning capacitance microscopy of ErAs nanoparticles embedded in GaAs pn junctions," APL, vol. 99, pp. 133114, Sep 2011. Digital object identifier

Conference Paper

  1. R. Wang, D. Chen, J. A. McArthur, X. Xue, S. R. Bank, and J. C. Campbell, "AlxIn1-xAsySb1-y digital alloy nBn photodetectors," 2021 IEEE Photonics Conference (IPC), Vancouver, BC, Canada, Oct 2021.
  2. J. A. McArthur, S. D. March, D. Chen, A. A. Dadey, A. H. Jones, J. C. Campbell, and S. R. Bank, "Background Carrier Polarity Switching in AlInAsSb Digital Alloys," 63nd Electronic Materials Conf. (EMC), Virtual, Jun 2021.
  3. R. H. El-Jaroudi, N. T. Sheehan, K. M. McNicholas, D. J. Ironside, A. F. Briggs, A. M. Skipper, S. D. Sifferman, and S. R. Bank, "Strain Engineering of Nanomembranes with Amorphous Silicon," 60th Electronic Materials Conf. (EMC), Santa Barbara, CA, Jun 2018.
  4. (Invited) S. R. Bank, S. D. Sifferman, H. P. Nair, N. T. Sheehan, R. Salas, S. J. Maddox, and A. M. Crook, "Highly strained type-I diode lasers on GaSb," SPIE Photonics West, San Francisco, CA, Feb 2016.
  5. R. Salas, N. T. Sheehan, S. Guchhait, K. M. McNicholas, S. D. Sifferman, V. D. Dasika, E. M. Krivoy, and S. R. Bank, "Properties of Growth Enhanced ErAs:InGaAs Nanocomposites," 57th Electronic Materials Conf. (EMC), Columbus, OH, Jun 2015.
  6. S. D. Sifferman, R. Salas, S. J. Maddox, H. P. Nair, N. T. Sheehan, E. M. Krivoy, E. S. Walker, and S. R. Bank, "Surfactant-mediated growth of highly strained materials for mid-infrared applications," 57th Electronic Materials Conf. (EMC), Columbus, OH, Jun 2015.
  7. K. W. Park, H. P. Nair, E. M. Krivoy, S. R. Bank, and E. T. Yu, "Thermal characterization of rare earth/III-V superlattice and nanocomposite structures using scanned probe microscopy," 55th Electronic Materials Conf. (EMC), South Bend, IN, Jun 2013.
  8. H. P. Nair, R. Salas, N. T. Sheehan, S. J. Maddox, and S. R. Bank, "3. 4 \µm Diode Lasers Employing Al-Free GaInAsSb/GaSb MQW Active Regions at 20°C," 71st Device Research Conf. (DRC), South Bend, IN, Jun 2013.
  9. V. D. Dasika, E. M. Krivoy, H. P. Nair, S. J. Maddox, K. W. Park, D. Jung, M. L. Lee, E. T. Yu, and S. R. Bank, "InAs Quantum Dot Growth using Bismuth as a Surfactant for Optoelectronic Applications," Conf. on Lasers and Electro Optics (CLEO), San Jose, CA, Jun 2013.
  10. K. W. Park, H. P. Nair, S. R. Bank, and E. T. Yu, "Proximal Probe Characterization of Thermal Conductivity in ErAs/GaAs Superlattice Grown by Molecular Beam Epitaxy," 40th Conference on the Physics & Chemistry of Surfaces & Interfaces, Waikoloa, HI, Jan 2013.
  11. K. W. Park, V. D. Dasika, H. P. Nair, A. M. Crook, S. R. Bank, and E. T. Yu, "Scanned Probe Characterization of ErAs/GaAs Nanostructures below the Resolution Limit via Statistical Analysis," International Symposium on Compound Semiconductors (ISCS), Santa Barbara, CA, Aug 2012.
  12. V. D. Dasika, E. M. Krivoy, H. P. Nair, K. W. Park, E. T. Yu, and S. R. Bank, "InAs Quantum Dot Growth using Bi as a Surfactant," 54th Electronic Materials Conf. (EMC), University Park, PA, Jun 2012.
  13. A. M. Crook, H. P. Nair, K. W. Park, E. T. Yu, and S. R. Bank, "Investigating the MBE Overgrowth of Semimetallic Nanoparticles for Nanophotonics," North American Molecular Beam Epitaxy Conf. (NAMBE), Breckenridge, CO, Sep 2010.
  14. H. P. Nair, A. M. Crook, K. W. Park, D. A. Ferrer, S. K. Banerjee, E. T. Yu, and S. R. Bank, "Investigation of MBE-grown ErAs nanoparticle morphology for high-performance optical and electronic devices," North American Molecular Beam Epitaxy Conference (NAMBE), Breckenridge, CO, Sep 2010.
  15. A. M. Crook, H. P. Nair, K. W. Park, E. T. Yu, and S. R. Bank, "Overgrowth Investigation of Epitaxial Semimetallic Nanoparticles for Photonic Devices," 52nd Electronic Materials Conf. (EMC), Notre Dame, IN, Jun 2010.
  16. K. W. Park, A. M. Crook, H. P. Nair, S. R. Bank, and E. T. Yu, "Scanned Probe Characterization of Self-Assembled ErAs/GaAs Semimetal/Semiconductor Nanostructures Grown by Molecular Beam Epitaxy," 52nd Electronic Materials Conf. (EMC), Notre Dame, IN, Jun 2010.